EVIDENT

LEXT-OLS5100 Microscope Confocal à Balayage Laser pour l'Analyse des Matériaux

Référence: EVI-LEXT-OLS5100

Microscope laser confocal 3D pour la métrologie des surfaces sans contact.
Le modèle Olympus / Evident LEXT OLS5100 offre une précision submicronique pour l'inspection des matériaux et le contrôle de la qualité.

- Précision submicronique garantie pour les mesures 3D (compatible avec la norme ISO 25178)
- Balayage à grande vitesse et assemblage panoramique pour une large zone de couverture
- Optique avancée avec faible aberration sur l'ensemble du champ de vision
- L'analyse automatisée et l'interface intuitive rationalisent les opérations
- Convient aux métaux, aux semi-conducteurs, aux polymères, etc.

Utilisé pour la R&D et le contrôle qualité dans diverses industries.
Analis peut configurer le système en fonction de vos besoins d'inspection.

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LEXT-OLS5100 Microscope Confocal à Balayage Laser pour l'Analyse des Matériaux

Documents connexes

NOM DU DOCUMENT

DATE DE SORTIE

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Brochure EVIDENT LEXT-OLS5100 3D Measuring Laser Microscope EN.pdf

26 / 03 / 2025

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Accessoires, consommables et produits connexes

EVIDENT

LEXT OLS5500 Profilomètre optique 3D pour la métrologie de surface

Reference : EVI-LEXT-OLS5500

The Evident LEXT™ OLS5500 is a hybrid 3D optical profilometer that combines laser scanning microscopy (LSM), white light interferometry (WLI), and focus variation microscopy (FVM) in one platform. It delivers precise, traceable surface measurements from the nanometer to the millimeter scale, enabling confident inspection in R&D, QA, and QC environments.

Designed for challenging materials, including reflective, transparent, steep, or low-contrast surfaces, the OLS5500 provides exceptional clarity, guaranteed accuracy, and repeatable results supported by verifiable calibration. Its advanced WLI mode improves throughput by up to 40× compared to conventional LSM, while dedicated LEXT objectives ensure reliable measurements across complex geometries.

Key Advantages at a Glance

3-in-1 hybrid profilometry (LSM, WLI, FVM) for comprehensive surface analysis
Guaranteed accuracy and repeatability for LSM and WLI measurements*
Nanometer-scale measurement noise (1 nm with LEXT 100X LSM objectives; 0.08 nm with WLI optics)
High-speed WLI acquisition providing up to 40× faster throughput
Advanced optics with high-NA WLI lenses and distortion-free LEXT objectives
4K imaging, contrast enhancement, and shading correction for clear visualization of every surface type
Automated workflows including Smart Scan II, tilt-adjustment assistance, measurement macros, and Smart Judge data filtering

*As specified by Evident, valid after calibration under manufacturer-defined conditions.

Suitable For

The OLS5500 supports accurate, non-contact surface metrology across a wide range of research and industrial needs:

• Semiconductors and MEMS: wafer roughness, step height, pattern fidelity, microcrack detection

• Electronics: copper traces, PCB features, defect and wear analysis

• Polymers and composites: transparent films, layered materials, surface defects

• Metals and alloys: finishing quality, machining evaluation, grain and texture analysis

• Coatings and surface treatments: film thickness, slope measurement, uniformity inspection

Used in R&D, process development, and production QC, the OLS5500 delivers trusted, traceable 3D data for demanding surface characterization workflows.

Download brochure below for full specifications.
Ask Analis local Benelux experts for more information, a demonstration or a personalized quotation.