The METRIOS 332 by VICIVISION is here and you can be the first to test it The METRIOS 332 is soon available in our Analis Metrology Lab An ultra-high magnification sensor detects points in X-Y-Z even on the smallest details. The METRIOS by VICIVISION - Optical Measuring Mac... Metrology Lire plus...
Upgrade to Natural Refrigerant Technology with the JULABO Trade-In Program Why upgrade your current refrigerated circulators? As laboratories prepare for the gradual transition to low-GWP refrigerants, many organisations are reviewing the long-term sustainability and service... Circulation baths Heating & cooling Promo Lire plus...
Preparing Your Laboratory for the 2027 EU Refrigerant Regulation The European Union is tightening rules on fluorinated greenhouse gases (F-gases) to reduce emissions and support the transition to low-GWP cooling technologies. ( http://data.europa.eu/eli/reg/2024/57... Heating & cooling Lire plus...
New Shining 3D Partnership to Offer New Metrology 3D Laser Scanning Solutions We are pleased to announce our new partnership with SHINING 3D to offer New Metrology 3D Laser Scanning Solutions For over 20 years, the company has focused on R&D and manufacturing of high-precision ... Metrology Lire plus...
𝗧𝗿𝗶𝗺𝗼𝘀 𝗩𝟰+ 𝗛𝗲𝗶𝗴𝗵𝘁 𝗚𝗮𝘂𝗴𝗲 We’re excited to introduce the all-new 𝗧𝗿𝗶𝗺𝗼𝘀 𝗩𝟰+ 𝗛𝗲𝗶𝗴𝗵𝘁𝗚𝗮𝘂𝗴𝗲 ! New standard in height gauge performance for ultra-precise vertical-measurement. Designed with workshops in mind, it’s the perfect cost-... 1D & 2D Height gauges Metrology Lire plus...
Contrôle Qualité Clinique This new liquid liquid frozen clinical quality controls are assayed with target values and are suitable for use on various analysers. As one of the most comprehensive control ranges on the market, the... Clinical quality controls Lire plus...
Working in Particle Characterization & Zeta Potential analysis ? Découvrez la série BeNano : La dernière génération d'analyseur de taille de nanoparticules et de potentiel zêta conçue par notre fournisseur Bettersize Instruments. La diffusion dynamique de la lumi... Particle characterization Lire plus...