Non-contact surface measurement systems

Non-contact 3D surface characterization

For characterizing precision-manufactured and functional or sophisticated surfaces in detail and 3D, it requires measurement technology that is reliable, fast and precise. 
Guaranteeing functionality and detecting defects at an early stage avoids unnecessary cost and increases the overall product quality and lifetime. 
TopMap from Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces.   White-light interferometers of the TopMap sensor family are established optical quality inspection tools for the controls laboratory, in production environments or in-line. 
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TopMap Micro.View polytec Optical 3D surface profilers
POLYTEC TopMap Micro.View

TopMap Micro.View® is an easy-to-use and compact optical profiler. 
Choose Micro.View® as the cost-effective quality control solution for surface analysis of precision-engineering, for inspecting roughness, microstructures and more surface details.

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TopMap Micro.View+ polytec Optical 3D surface profilers

POLYTEC TopMap Micro.View+

TopMap Micro.View®+ is the next generation optical surface profiler in a modular design to reliably measure the most challenging analysis tasks regarding surface finish and 
microstructures with utmost precision. 
Focus Finder and Focus Tracker assist in keeping samples focused at all times, with fully motorized positioning units ready for automation. 

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TopMap Pro.Surf. Polytec Optical 3D surface profilers
POLYTEC TopMap Pro.Surf.

Ideal for quick and precise 3D surface characterization. 
The areal measurement of the TopMap Pro.Surf ensures to not miss any details when inspecting your workpiece surface. 
Short measuring times and a large field-of-view characterize the TopMap Pro.Surf.

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TopMap Pro.Surf+ polytec
POLYTEC TopMap Pro.Surf+

The all-in-one 3D optical surface profiler from Polytec. 
The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. 
Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.

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TopMap Metro.Lab polytec Optical 3D surface profilers

POLYTEC TopMap Metro.Lab

Being a complete measuring station, the TopMap Metro.Lab is ideally suited to large-area topographies on almost all surfaces. 
Since it offers great value for money, it is also attractive for smaller companies with fewer tasks.

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