Particle Size Distribution Analysis for Quality and Performance
Understanding particle size and its distribution is essential, as it directly impacts product performance, process efficiency, and overall quality. Laser diffraction is the most widely used technique for particle size analysis, offering fast, precise, and reproducible measurements.
With advanced solutions from Beckman Coulter and Bettersize, laboratories can optimize formulations, improve manufacturing processes, and ensure consistent product characteristics.
What Are Particle Size and Particle Size Distribution?
Particle size is typically expressed in millimeters (mm), micrometers (µm), or nanometers (nm), with particle diameter being the most commonly used parameter.
Particle size distribution describes how particles of different sizes are distributed within a sample (e.g. powders, suspensions). It is usually expressed as a percentage of particles within defined size ranges.
Laser diffraction provides a volume-based distribution, making it a reliable method for characterizing particle populations.
How Does Laser Diffraction Work?

Laser diffraction is based on the principle of light scattering:
- A laser beam passes through a sample (liquid suspension or dry powder)
- Particles scatter light at different angles depending on their size
- Detectors measure the intensity and angle of scattered light
- Mathematical models (Mie theory or Fraunhofer approximation) convert this data into particle size distribution
Output:
- Particle size distribution (histogram or cumulative curve)
- Volume-based particle population analysis
This method is fast, non-destructive, and highly reproducible, making it a standard in particle characterization.
Key Benefits of Laser Diffraction
- Rapid and accurate measurements
- Wide dynamic range
- Non-destructive analysis
- Suitable for a broad range of materials
- Ideal for quality control, R&D, and process optimization
Typical Applications
- Pharmaceuticals (formulation, API characterization)
- Materials science (powders, dispersions)
- Environmental analysis
- Food and chemical industries
- Manufacturing and process control

Laser Diffraction Instruments
LS 13 320 XR – Beckman Coulter
Laser Diffraction Particle Size Analyzer
- Advanced PIDS technology for high-resolution measurements
- Expanded dynamic range
- Fast and reliable results
- Optimized workflows
Bettersizer S3 Plus
Particle Size and Shape Analyzer
- Combines laser diffraction with dynamic image analysis
- Measures both particle size and shape
- Range: 0.01 µm – 3500 µm
- High sensitivity for both fine and coarse particles
Bettersizer 2600
Versatile Laser Diffraction Analyzer
- Wet and dry measurement modes
- Modular design for multiple applications
- Range: 0.02 µm – 2600 µm
- Accurate and flexible characterization
Our products
The dry powder system module delivers reliable results from 400 nm - 3500 µm for all types of homogeneous and heterogeneous samples that can be dispersed dry.
Analytical size range: 400 nm - 3500 µm
- Measures entire sample as required by the ISO 13 320 Standard
- Programmable Obscuration setting to optimize sample feed rate
- User-selectable vacuum pressure for maximum dispersion control
The LS 13 320 XR laser diffraction particle sizing analyzer offers best-in-class particle size distribution data from advanced PIDS technology, which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR particle size analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency. Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data.
- Direct measurement range from 10 nm – 3500 µm
- Automatically highlights pass/fail results for faster quality control
- Enhanced software that simplifies method creation for standardized measurements
- New control standards to adequately verify instrument/module performance
G15 15µm Silica Carbide Control for use with the LS 13 320 XR particle size analyzer.
G35D 35 µm Silica Carbide Control for use with the LS 13 320 XR particle size analyzer.